Gianfranco Genta

• Traceable synthetic dataset generator for nanoindentation
  software
  

  Maculotti, Giacomo; Giorio, Lorenzo; Genta, Gianfranco; Galetto, Maurizio
  DOI:10.5281/zenodo.17465545

• Code for Bootstrap simulation of nanoindentation data
  software
  

  Maculotti, Giacomo; Giorio, Lorenzo; Genta, Gianfranco; Galetto, Maurizio
  DOI:10.5281/zenodo.17054598

• Nanoindentation dataset - Fused Silica and Tungsten
  dataset
  

  Maculotti, Giacomo; Genta, Gianfranco; Galetto, Maurizio
  DOI:10.5281/zenodo.17054481

• Digital Metrology for Nanoindentation: Synthetic Data Generator for Error Identification
  Article
  

  Maculotti, G.; Giorio, L.; Genta, G.; Galetto, M.
  MICROMACHINES
  Multidisciplinary Digital Publishing Institute (MDPI)
  Vol.16 pp.20 (pp.1-20) ISSN:2072-666X DOI:10.3390/mi16121394

• Metrological Comparison of Indirect Calibration Methods for Nanoindentation: A Bootstrap-Based Approach
  Article
  

  Maculotti, G.; Giorio, L.; Genta, G.; Galetto, M.
  MATERIALS
  Multidisciplinary Digital Publishing Institute (MDPI)
  Vol.18 pp.19 (pp.1-19) ISSN:1996-1944 DOI:10.3390/ma18184382

• Nanoscale topographical characterization of permeability-related features in the production of polymeric films for food packaging
  Proceeding
  

  Maculotti, G.; Piovano, A.; Genta, G.; Galetto, M.
  MATERIALS RESEARCH PROCEEDINGS
  In: Materials Research Proceedings
  Association of American Publishers
  17th Italian Manufacturing Association Conference, AITeM 2025 (Bari) 10-12 September 2025
  Vol.57 pp.8 (pp.575-582) ISSN:2474-3941 DOI:10.21741/978164490373567

• Traceability and uncertainty of defects automated measurements by CNN-powered Machine Vision Systems
  Article
  

  Maculotti, G.; Giorio, L.; Genta, G.; Galetto, M.
  CIRP ANNALS
  Elsevier
  Vol.74 pp.5 (pp.661-665) ISSN:0007-8506 DOI:10.1016/j.cirp.2025.03.023

• Traceability for indentation measurements in Brinell-Vickers-Knoop hardness
  Proceeding
  

  Kuzu, C.; Germak, A.; Menelao, F.; Stibler, A.; Genta, G.; Loewit, M.; Borovsky, J.; Maculotti, G.; Hiti, M.; Prato, A.; Pelit, E.; Fidelus, J.; Apostol, T.; Alisic, S.; Fakic, B.; Reinstadt, P.; Turotti, F.; Affri, R.; Muminovic, B.; Alic, A.
  MEASUREMENT. SENSORS
  In: Proceedings of the XXIV IMEKO World Congress
  Elsevier Ltd
  Proceedings of the XXIV IMEKO World Congress (Hamburg (Germany)) 26-29 August 2024
  Vol.38 ISSN:2665-9174 DOI:10.1016/j.measen.2024.101453

• A value-driven approach to printed circuit board inspection: Strategic use of inspection technologies to reduce waste
  Proceeding
  

  Puttero, S.; Verna, E.; Genta, G.; Galetto, M.
  MATERIALS RESEARCH PROCEEDINGS
  In: Italian Manufacturing Association Conference – XVII AITeM
  Material Research Forum LLC (STATI UNITI D'AMERICA)
  XVII Convegno dell'Associazione Italiana delle Tecnologie Manifatturiere (XVII AITeM) (Bari) 9-12 Settembre 2025
  Vol.57 pp.8 (pp.402-409) ISSN:2474-395X ISBN:9781644903735 DOI:10.21741/9781644903735-47

• Automatic component recognition and defect detection in electronic board recycling process
  Article
  

  Puttero, Stefano; Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio
  INTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING
  Taylor&Francis
  pp.16 (pp.1-16) ISSN:0951-192X DOI:10.1080/0951192x.2025.2515393

Total: 170