Gianfranco Genta

• Towards Zero Defect Manufacturing: probabilistic model for quality control effectiveness
  Proceeding
  

  Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio; Franceschini, Fiorenzo
  In: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
  IEEE
  2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) (Virtual Conference) June 7-9, 2021
  pp.5 (pp.522-526) ISBN:9781665419796 DOI:10.1109/MetroInd4.0IoT51437.2021.9488487

• Effect of process parameters on parts quality and process efficiency of Fused Deposition Modeling
  Article
  

  Galetto, Maurizio; Verna, Elisa; Genta, Gianfranco
  COMPUTERS & INDUSTRIAL ENGINEERING
  Elsevier
  Vol.156 pp.16 ISSN:0360-8352 DOI:10.1016/j.cie.2021.107238

• Defect prediction models to improve assembly processes in low-volume productions
  Proceeding
  

  Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio; Franceschini, Fiorenzo
  PROCEDIA CIRP
  In: 8th CIRP Conference of Assembly Technology and Systems
  Elsevier
  8th CIRP Conference of Assembly Technology and Systems (Athens (Greece)) 29 Settembre - 1 Ottobre 2020
  Vol.97 pp.6 (pp.148-153) ISSN:2212-8271 DOI:10.1016/j.procir.2020.05.217

• Defect prediction model for wrapping machines assembly
  Proceeding
  

  Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio; Franceschini, Fiorenzo
  In: Proceedings book of the 4th International Conference on Quality Engineering and Management, 2020
  International Conference on Quality Engineering and Management
  4th International Conference on Quality Engineering and Management 21-22 September 2020
  pp.20 (pp.115-134) ISBN:9789895491100

• A reliable sampling method to reduce large sets of measurements: a case study on the calibration of digital 3-axis MEMS accelerometers
  Proceeding
  

  Prato, Andrea; Schiavi, Alessandro; Mazzoleni, Fabrizio; Touré, Amara; Genta, Gianfranco; Galetto, Maurizio
  In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT
  IEEE (STATI UNITI D'AMERICA)
  2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT 3-5 giugno 2020
  pp.5 (pp.537-541) DOI:10.1109/MetroInd4.0IoT48571.2020.9138293

• Inspection procedures in manufacturing processes: recent studies and research perspectives
  Article
  

  Genta, Gianfranco; Galetto, Maurizio; Franceschini, Fiorenzo
  INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
  Taylor & Francis
  Vol.58 pp.22 (pp.4767-4788) ISSN:0020-7543 DOI:10.1080/00207543.2020.1766713

• Defect Probability Estimation for Hardness-Optimised Parts by Selective Laser Melting
  Article
  

  Galetto, Maurizio; Genta, Gianfranco; Maculotti, Giacomo; Verna, Elisa
  INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
  Springer
  Vol.21 pp.15 (pp.1739-1753) ISSN:2234-7593 DOI:10.1007/s12541-020-00381-1

• Uncertainty evaluation in the prediction of defects and costs for quality inspection planning in low-volume productions
  Article
  

  Galetto, Maurizio; Verna, Elisa; Genta, Gianfranco; Franceschini, Fiorenzo
  THE INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
  Springer
  Vol.108 pp.13 (pp.3793-3805) ISSN:1433-3015 DOI:10.1007/s00170-020-05356-0

• Single-step calibration method for nano indentation testing machines
  Article
  

  Galetto, Maurizio; Genta, Gianfranco; Maculotti, Giacomo
  CIRP ANNALS
  Elsevier
  Vol.69 pp.4 (pp.429-432) ISSN:0007-8506 DOI:10.1016/j.cirp.2020.03.015

• Criticalities of iterative calibration procedures for indentation testing machines in the nano-range
  Proceeding
  

  Maculotti, Giacomo; Genta, Gianfranco; Galetto, Maurizio
  In: European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 20th International Conference and Exhibition, EUSPEN 2020
  euspen
  20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020
  pp.4

Total: 139